Particle Characterization

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ZetaView®QUATT

Nanoparticle Tracking Analyzer ZetaView® is a nanoparticle tracking analysis (NTA) instrument for measuring hydrodynamic particle size, zeta potential, concentration and fluorescence.

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ZetaView®TWIN

Nanoparticle Tracking Analyzer ZetaView® is a nanoparticle tracking analysis (NTA) instrument for measuring hydrodynamic particle size, zeta potential, concentration and fluorescence.

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ZetaView®MONO

Nanoparticle Tracking Analyzer ZetaView® is a nanoparticle tracking analysis (NTA) instrument for measuring hydrodynamic particle size, zeta potential, concentration and fluorescence.

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Genie G

RephiLe provides a full range of lab water systems for small to medium size applications (water production 10 – 300 liters per hour).

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ADM01

The DustMon ADM01 was designed to reliably determine the dustiness of granular products and powders. The Dust Analyzer DustMon ADM01 characterizes the dustiness of powders and granulates and is an ideal system to measure the amount and concentration of dust. The analysis method offers a real-time measurement with up to 1000 measurements per second. All results will be stored and can be transferred into other databases such as Excel.

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AS101

Microtrac MRB’s PARTAN 3D can measure 40 morphological parameters of your material including size, shape, surface roughness, density, transparency, and of course 3D in one fast analysis. The PARTAN 3D can measure particles ranging in size from 22 µm to 35 mm.

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MN421-Q

The NANOTRAC WAVE II provides users with superior particle analysis capability by taking advantage of an enhanced optical signal, innovative probe technology, and advanced algorithms. Whether your material is ppm or near finished product, the WAVE II obtains fast, sensitive, and precise measurements of materials ranging from sub-nanometer to several microns.

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MN421

The NANOTRAC WAVE II provides users with superior particle analysis capability by taking advantage of an enhanced optical signal, innovative probe technology, and advanced algorithms. Whether your material is ppm or near finished product, the WAVE II obtains fast, sensitive, and precise measurements of materials ranging from sub-nanometer to several microns.

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AEROTRAC II

The AEROTRAC II is an analyzer for particle size distributions & concentration ratio analysis (calculated from transmitted laser light) for suspended particulates in air such as atomized droplets, powders, spray particles, mist and etc.

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M3551-1

The BLUEWAVE is optimized for materials below 1 micron delivering unsurpassed resolution. The BLUEWAVE measures particle size from 0.01 to 2,800 µm. Microtrac MRB has a tradition of delivering innovative solutions in particle size analysis through light scattering technology. The BLUEWAVE laser diffraction analyzer is a continuation of that tradition. Utilizing the patented tri-laser technology, the BLUEWAVE provides accurate, reliable and repeatable particle size information for applications ranging from research and development to production, process, and quality control. The BLUEWAVE complies with or exceeds ISO 13320-1 particle size analysis – light diffraction methods.

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M3551

THE INDUSTRY PREFERRED LASER DIFFRACTION ANALYZER, IDEAL FOR PARTICLE CHARACTERIZATION The Microtrac S3500 is the first particle size analyzer that uses three precisely placed red laser diodes to accurately characterize particles like never before. The patented Tri-Laser System provides accurate, reliable and repeatable particle size analysis for a diverse range of applications by utilizing the proven theory of Mie compensation for spherical particles and the proprietary principle of Modified Mie calculations for non-spherical particles. The S3500 measures particle size from 0.02 to 2,800 µm.

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M5001

With the SYNC particle analyzer, Microtrac MRB integrates its highly accurate tri-laser diffraction analyzer technology with its versatile dynamic image analysis capability to provide particle characterization practitioners with a unique measuring experience. The patented synchronous measurement technology allows users to make both a laser diffraction measurement and an image analysis measurement on a single sample, in the same sample cell at the same time: One sample One optical bench One flow path One sample cell One analysis

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