Material Science

NEXOPART e200 LS air jet sieve uses targeted airflow to analyze fine, sticky powders from 10 µm to 4 mm with automatic RFID sieve detection.

NEXOPART EML 200 Pure: an easy, affordable test sieve shaker for standard sieve analysis. Available from Omega Scientific Thailand.

The EML 200 Premium is highly suited for users who have special requirements for precise and reproducible sieve analyses, 20 µm–125 mm.

The Hitachi NEXTA DMA200 tracks viscoelastic traits, material stiffness, and glass transition with an innovative Real View camera for micro-analysis.

NOTE: The Curinscan is now discontinued. 

Microstructure thermal analyzer

RephiLe Genie G produces Type I ultrapure & Type II EDI water from tap water, featuring IoT integration and RFID tracking for labs in Thailand.

The DustMon ADM01 was designed to reliably determine the dustiness of granular products and powders. The Dust Analyzer DustMon ADM01 characterizes the dustiness of powders and granulates and is an ideal system to measure the amount and concentration of dust. The analysis method offers a real-time measurement with up to 1000 measurements per second. All results will be stored and can be transferred into other databases such as Excel.

Microtrac MRB’s PARTAN 3D can measure 40 morphological parameters of your material including size, shape, surface roughness, density, transparency, and of course 3D in one fast analysis. The PARTAN 3D can measure particles ranging in size from 22 µm to 35 mm.

The NANOTRAC WAVE II provides users with superior particle analysis capability by taking advantage of an enhanced optical signal, innovative probe technology, and advanced algorithms. Whether your material is ppm or near finished product, the WAVE II obtains fast, sensitive, and precise measurements of materials ranging from sub-nanometer to several microns.

The NANOTRAC WAVE II provides users with superior particle analysis capability by taking advantage of an enhanced optical signal, innovative probe technology, and advanced algorithms. Whether your material is ppm or near finished product, the WAVE II obtains fast, sensitive, and precise measurements of materials ranging from sub-nanometer to several microns.

The AEROTRAC II is an analyzer for particle size distributions & concentration ratio analysis (calculated from transmitted laser light) for suspended particulates in air such as atomized droplets, powders, spray particles, mist and etc.

The BLUEWAVE is optimized for materials below 1 micron delivering unsurpassed resolution. The BLUEWAVE measures particle size from 0.01 to 2,800 µm. Microtrac MRB has a tradition of delivering innovative solutions in particle size analysis through light scattering technology. The BLUEWAVE laser diffraction analyzer is a continuation of that tradition. Utilizing the patented tri-laser technology, the BLUEWAVE provides accurate, reliable and repeatable particle size information for applications ranging from research and development to production, process, and quality control. The BLUEWAVE complies with or exceeds ISO 13320-1 particle size analysis – light diffraction methods.

THE INDUSTRY PREFERRED LASER DIFFRACTION ANALYZER, IDEAL FOR PARTICLE CHARACTERIZATION The Microtrac S3500 is the first particle size analyzer that uses three precisely placed red laser diodes to accurately characterize particles like never before. The patented Tri-Laser System provides accurate, reliable and repeatable particle size analysis for a diverse range of applications by utilizing the proven theory of Mie compensation for spherical particles and the proprietary principle of Modified Mie calculations for non-spherical particles. The S3500 measures particle size from 0.02 to 2,800 µm.

Microtrac SYNC combines laser diffraction and dynamic image analysis for simultaneous particle size and shape characterization down to 0.01 µm.

Hitachi TMA7000 series: double the sensitivity, measures thin films & small samples, with easy push, penetration & tension mode switching.

NOTE: The Hitachi DSC7000 is now discontinued. 

NEXTA DSC series delivers superior sensitivity, exceptional baseline stability, and wider Real View® temperature range for material analysis.

Hitachi NEXTA STA measures TGA and DSC simultaneously up to 1,500°C, with baseline stability of less than 10 µg and real-time RealView imaging.